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10.1017/hpl.2015.31SCIBercegol H, 2003, P SOC PHOTO-OPT INS, V5273, P312, DOI 10.1117/12.524843; Hacker E, 1996, P SOC PHOTO-OPT INS, V2714, P316, DOI 10.1117/12.240376; Hue J, 1997, P SOC PHOTO-OPT INS, V2966, P451, DOI 10.1117/12.274250; Lamaignere L., 2012, ADV TOPICS MEASUREME; NAKANO H, 1990, OPT COMMUN, V78, P123, DOI 10.1016/0030-4018(90)90107-5; NAKANO H, 1993, J APPL PHYS, V73, P2122, DOI 10.1063/1.353159; STEWART AF, 1984, APPL OPTICS, V23, P3741, DOI 10.1364/AO.23.003741769400053High Power Laser Sci. Eng.2015amplified spontaneous emission; damage threshold test; partially coherence; uniform intensity distributionND-GLASS; LASERA method to evaluate damage in optical elements with the near field of an amplified spontaneous emission (ASE) beam has been developed. Local peak intensities are generally distributed randomly in the near field of a laser beam. The partial coherence of the ASE source results in a very smooth beam profile. The coherence time of ASE is much less than the pulse width. Small-scale intensity modulations can be smoothed out rapidly within the time of a pulse width. In the experiments, ASE is generated from a multifunctional high-performance Nd:glass system, with a pulse duration of 3ns, a spectral width (full width at half maximum, FWHM) of 1nm and an adjustable energy range from 1 to 10J. The damage thresholds of samples induced by ASE are two to three times higher than those induced by a laser with the same size of test spot. Furthermore, the ASE beam has great potential for the detection of defects over a large area and the conditioning of optical elements.http://www.opticsjournal.net/Journals/hpl.htmEvaluating damage in optical elements using an amplified spontaneous emission beam期刊论文EnglishZhou, Qiong; Wang, Jiangfeng; Guo, Yajing; Liu, Dean; Zhu, Jianqiange30 WOS:000366321500001
外文题目: Evaluating damage in optical elements using an amplified spontaneous emission beam
作者: Zhou, Qiong; Wang, Jiangfeng; Guo, Yajing; Liu, Dean; Zhu, Jianqiang
刊名: High Power Laser Sci. Eng.
年: 2015 卷: 3 文章编号:e30
英文关键词:
amplified spontaneous emission; damage threshold test; partially coherence; uniform intensity distribution
ND-GLASS; LASER
英文摘要:
文献类型: 期刊论文
正文语种: English
收录类别: SCI  
DOI: 10.1017/hpl.2015.31
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